Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Agrawal, V.D. Editorial. J Electron Test 23, 465 (2007). https://doi.org/10.1007/s10836-007-5060-0
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10836-007-5060-0