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Comparison of NIST and Wavelet Transform Test Point Selection Methods For a Programmable Gain Amplifier

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Abstract

A comparison of test point selection methods using a linear matrix model based on the National Institute of Standard method and wavelet transform to reduce the number of test points, and hence, the test time, for a programmable gain amplifier (PGA) was investigated. The concept of integral nonlinearity (INL) was used to predict the performance of the PGA. It was found that the NIST method retained the original properties of the INL of the PGA. As such, the NIST method is able to predict the test responses of the PGA much more accurately than the wavelet transform method, using only 3 test points instead of the 155 test points as required in a full test.

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Acknowledgment

The authors would like to acknowledge the support of Texas Instruments, Inc., in the study of this work.

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Authors and Affiliations

  1. University of Arkansas, 3217 Bell Engineering Center, Fayetteville, AR, 72701, USA

    Xinsong Zhang & Simon S. Ang

  2. Texas Instruments Inc., 12500 TI Boulevard, Dallas, TX, 75243, USA

    Chandra Carter

Authors
  1. Xinsong Zhang
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  2. Simon S. Ang
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  3. Chandra Carter
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Corresponding author

Correspondence to Xinsong Zhang.

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Responsible Editor: M. Sachdev

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Zhang, X., Ang, S.S. & Carter, C. Comparison of NIST and Wavelet Transform Test Point Selection Methods For a Programmable Gain Amplifier. J Electron Test 24, 449–460 (2008). https://doi.org/10.1007/s10836-008-5070-6

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  • DOI: https://doi.org/10.1007/s10836-008-5070-6

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