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Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture

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Abstract

Remote testing requires embedded test infrastructure, consisting of communication, test control and test access. This article presents an embedded test solution for a low-frequency audio board. Supporting analog testing, the solution consists of a measurement and calculation method for passive component characterization, analog test bus solution and an embedded test controller for controlling embedded tests and providing test stimuli. Moreover, the solution, which supports the presented test plan, was compared to a test plan supporting traditional testing. It was found that the embedded test solution provided a 29% test coverage of the audio board components and substituted flying probe testing included in the traditional test plan. Besides such benefits as improved fault diagnostics and lower manufacturing costs, the paper also discusses the drawbacks of the presented solution, including reduced measurement accuracy. This paper also presents a correction to a previously presented passive component measurement and calculation method.

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Acknowledgment

The authors would like to acknowledge the Finnish Funding Agency for Technology and Innovation (TEKES), Nokia, Nokia Siemens Networks and Polar Electro for funding the Remote Access Testing Platform project under this work was carried out.

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Authors and Affiliations

  1. Microelectronics and Materials Physics Laboratories, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland

    Jari Hannu

  2. Optoelectronics and Measurement Techniques Laboratory, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland

    Teuvo Saikkonen, Juha Häkkinen & Markku Moilanen

  3. Electronics Laboratory, University of Oulu, P.O.Box 4500, FIN-90014, Oulu, Finland

    Juha Karttunen

Authors
  1. Jari Hannu
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  2. Teuvo Saikkonen
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  3. Juha Häkkinen
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  4. Juha Karttunen
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  5. Markku Moilanen
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Correspondence to Jari Hannu.

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Responsible Editor: K.-T. Cheng

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Hannu, J., Saikkonen, T., Häkkinen, J. et al. Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture. J Electron Test 26, 641–658 (2010). https://doi.org/10.1007/s10836-010-5175-6

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  • DOI: https://doi.org/10.1007/s10836-010-5175-6

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