Abstract
This paper presents a behavioral model that can be used to improve the manufacturability of systems based on MEMS convective sensors. This model permits to handle faults related to process scattering, taking into account not only the electrical and lateral geometrical parameters but also the influence of the cavity depth. Moreover correlations between conductive and convective phenomena are included. The model is validated with respect to FEM simulations and a very good agreement is obtained between the behavioral model and FEM results. The proposed model can then be used in system-level simulations, for instance to evaluate the impact of process scattering on the performances of the sensing part and/or to investigate different design and calibration strategies with respect to the system robustness.
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References
Abraham J (2008) Characterization and testing of microelectromechnical accelerometers. Proc. IEEE Int’l Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW’08)
Chaehoi A, Mailly F, Latorre L, Nouet P (2006) Experimental and finite-element study of convective accelerometer on CMOS. Sens Actuators A 132/1:78–84
Charlot B, Mir S, Parrain F, Courtois B (2001) Generation of electrically induced stimuli for MEMS self-test. Journal of Electronic Testing—Theory and Applications (JETTA) 17(6)
da Silva MG, Schröpfer G, Blackwell B, Ramalingam A (2007) Designing MEMS for Reliability (DFR). Proc. International Conference On Emerging Research And Advances In Mechanical Engineering
De Bruyker D, Cozma A, Puers R A combined piezoresistive/capacitive pressure sensor with self-test function based on thermal actuation. Sensors and Actuators A: Physical 66(1-3): 70-75
Deb N, Blanton RD (2002) Built-in self test of CMOS MEMS accelerometers. Proc. IEEE Int’l Test Conference (ITC’02) pp. 1075–1084
Dumas N, Azaïs F, Latorre L, Nouet, P (2005) On-chip electro-thermal stimulus generation for a MEMS-based magnetic field sensor. Proc. IEEE VLSI Test Symposium (VTS’05), pp. 213-218
Dumas N, Azaïs F, Mailly F, Nouet P (2008) Evaluation of a fully electrical test and calibration method for MEMS capacitive accelerometers. Proc. IEEE Int’l Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW’08)
Dumas N et al. (2008) A novel method for test and calibration of capacitive accelerometers with a fully electrical setup. Proc. IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’08)
Leman O, Chaehoi A, Mailly F, Latorre L, Nouet P (2007) Modeling and system-level simulation of a CMOS convective accelerometer. Solid State Electron 51(11–12):1609–1617
Leman O, Mailly F, Latorre L, Nouet P (2008) HDL modeling of convective accelerometers for system design and optimization. Sens Actuators A 142:178–184
Luo XB, Li ZX, Guo ZY, Yang YJ (2003) Study on linearity of a micromachined convective accelerometer. Microelectron Eng 65:87–101
Natarajan V, Bhattacharya S, Chatterjee A (2006) Alternate electrical tests for extracting mechanical parameters of MEMS accelerometer sensors. Proc. IEEE VLSI Test Symposium (VTS’06)
Ortmanns M, Buhmann A, Manoli Y (2008) Comprehensive microsystems: interface circuits. 1, Chap 16, ISBN: 978-0-444-52190-3, Elsevier
Rekik AA, Azais F, Dumas N, Mailly F, Nouet P (2010) Modeling the influence of etching defects on the sensitivity of MEMS convective accelerometers. Proc. IEEE Int’l Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW’10), La Grande Motte, France, 7–9
Rekik AA, Azais F, Dumas N, Mailly F, Nouet P (2011) An electrical test method for MEMS convective accelerometers: development and evaluation, Accepted to Design And Test in Europe (DATE) conference
Rekik AA, Azaïs F, Dumas N, Masmoudi M, Mailly F, Nouet P (2010) A study of package effects on the behavior of MEMS convective accelerometers. Proc, Design, Test, Integration and Packaging of MEMS and MOEMS (DTIP 2010), Seville, Spain, 5–7
Rocha L et al (2008) Auto-calibrated capacitive MEMS accelerometer. Proc. IEEE Int’l Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW’08)
Zhao Y et al (2004) Thermal convection accelerometer with closed-loop heater control. US Patent 6,795,752 B1
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Rekik, A.A., Azaïs, F., Dumas, N. et al. A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level. J Electron Test 27, 411–423 (2011). https://doi.org/10.1007/s10836-011-5207-x
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DOI: https://doi.org/10.1007/s10836-011-5207-x