Skip to main content
Log in

Fault Tolerant Single Error Correction Encoders

  • Published:
Journal of Electronic Testing Aims and scope Submit manuscript

Abstract

Soft errors are an important issue for circuit reliability. To mitigate their effects on the system functionality, different techniques are used. In many cases Error Correcting Codes (ECC) are used to protect circuits. Single Error Correction (SEC) codes are commonly used in memories and can effectively remove errors as long as there is only one error per word. Soft errors however may also affect the circuits that implement the Error Correcting Codes: the encoder and the decoder. In this paper, the protection against soft errors in the ECC encoder is studied and an efficient fault tolerant implementation is proposed.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4

Similar content being viewed by others

References

  1. Blaum M, Goodman R, McEliece R (1988) The reliability of single error protected computer memories. IEEE Trans Comput 37(1):114–119

    Article  Google Scholar 

  2. Hamming RW (1950) Error detecting and error correcting codes. Bell System Tech J 29:147–160

    MathSciNet  Google Scholar 

  3. Haraszti TP (2000) CMOS memory circuits. Kluwer Academic Publishers

  4. Hsiao MY (1970) A Class of Optimal Minimum Odd-weight-column SEC-DED codes. IBM J Res Develop 14:395–301

    Article  Google Scholar 

  5. International technology roadmap for semiconductors (ITRS), edition (2007)

  6. Lin S, Costello DJ (2004) Error control coding, 2nd edn. Prentice-Hall, Inc., Upper Saddle River, NJ

  7. Naseer R, Draper J (2008) DEC ECC Design to Improve Memory Reliability in Sub-100nm Technologies. Proceedings of the IEEE International Conference on Electronics, Circuits and Systems, September, pp 586–589

  8. Nicolaidis M (2005) Design for Soft Error Mitigation. IEEE Trans Device Mater Reliab 5(3):405–418

    Article  Google Scholar 

  9. Saleh M, Serrano JJ, Patel JH (1990) Reliability of scrubbing recovery techniques for memory systems. IEEE Trans Rel 39(1):114–122

    Article  MATH  Google Scholar 

  10. Schrimpf RD, Fleetwood DM (2004) Radiation effects and soft errors in integrated circuits and electronic devices. World Scientific Publishing

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Costas Argyrides.

Additional information

Responsible Editor: K. K. Saluja

Rights and permissions

Reprints and permissions

About this article

Cite this article

Maestro, J.A., Reviriego, P., Argyrides, C. et al. Fault Tolerant Single Error Correction Encoders. J Electron Test 27, 215–218 (2011). https://doi.org/10.1007/s10836-011-5208-9

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10836-011-5208-9

Keywords

Navigation