Skip to main content
SpringerLink
Log in

A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis Distance

  • Published:
Journal of Electronic Testing Aims and scope Submit manuscript

Abstract

This paper presents a new analog circuit fault diagnosis method based on improved Mahalanobis Distance. The Mahalanobis Distance is improved according to the characteristics of analog circuit, and then introduced into analog circuit fault detection. First, the circuit testability was analyzed, and the relation of ambiguity groups was determined on the basis of the test matrix, and then the separable potential faulty components under the assumption of single fault were also determined. Finally, the suspicious components could be classified using the improved Mahalanobis Distance according to the feature values of the test points, so as to reduce the number of classes and enhance the speed when classifying faults. The experiment shows that the method can achieve fast analog circuit fault diagnosis and better results of analog circuit diagnosis detection.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7

Similar content being viewed by others

References

  1. Devarakond SK, Chatterjee A, Bhattacharya S, Sen S (2012) Concurrent device/specification cause-effect monitoring for yield diagnosis using alternate diagnostic signatures. IEEE Des Test Comput 29(1):48–58

    Article  Google Scholar 

  2. Grzechca D (2011) Simulated annealing with artificial neural network fitness function for ECG amplifier testing. In: 20th European Conference on Circuit Theory and Design (ECCTD). pp. 49–52. doi:10.1109/ECCTD.2011.6043396

  3. Grzechca D, Rutkowski J, Golonek T (2010) PCA application to frequency reduction for fault diagnosis in analog and mixed electronic circuit. In: Int Symp Circ Syst (ISCAS) IEEE 1919–1922. doi:10.1109/ISCAS.2010.5537989

  4. Huang K, Stratigopoulos H-G, Mir S (2010) Fault diagnosis of analog circuits based on machine learning. In: Design, Sutomation & Test in Europe Conference & Exhibition (DATE). pp. 1761–1766. http://www.engineeringvillage.com/controller/servlet/Controller?SEARCHID=M61f0c9ae13b8f2b7e37M7c6dprod2con1&CID=quickSearchDetailedFormat&DOCINDEX=1&database=1&format=quickSearchDetailedFormat&tagscope=&displayPagination=yes

  5. Huang K, Stratigopoulos H-G, Mir S, Hora C, Xing Y, Kruseman B (2012) Diagnosis of local spot defects in analog circuits. IEEE Trans Instrum Meas 61(10):2701–2712

    Article  Google Scholar 

  6. Liberatore A, Manetti S, Piccirlli MC (1994) A new efficient method for analog circuit testability measurement. In: Instrumentation and Measurement Technology Conference (IMTC) IEEE. pp. 193–196. http://www.engineeringvillage.com/controller/servlet/Controller?SEARCHID=4373073b13b8de65ebf5b05prod3con1&CID=quickSearchDetailedFormat&DOCINDEX=1&database=1&format=quickSearchDetailedFormat&tagscope=&displayPagination=yes

  7. Lijia X, Jianguo H, Houjun W (2010) A method for the diagnosis of the incipient faults in analog circuits using HMM[J]. J Comput Aided Des Comput Graph 22(7):1215–1222

    Article  Google Scholar 

  8. Long B, Tian SL, Wang HJ (2012) Feature vector selection method using Mahalanobis distance for diagnostics of analog circuits based on LS-SVM. J Electron Test Theory Appl. doi:10.1007/s10836-012-5301-8

  9. Mahalanobis PC (1936) On the generalized distance in statistics. Proc Natl Inst Sci India 12:49–55

    Google Scholar 

  10. Manetti S, Piccirilli MC et al (2003) A singular - value decomposition approach for ambiguity group determination in analog circuits[J]. IEEE Trans Circ Syst I Fundam Theory Appl 50(4):477–487

    Article  MathSciNet  Google Scholar 

  11. Peng W, Shi-yuan Y (2006) A soft fault dictionary method for analog circuit diagnosis based on slope fault mode[J]. Control Autom 22(6):1–23

    MATH  Google Scholar 

  12. Qing QQ, Zhang XA, Li AH (2009) Research on the application of Mahalanobis distance in catastrophic faults detection of analog circuits[J]. J Electron Meas Instrum 23(7):41–45

    Google Scholar 

  13. Qing QQ, Zhang XA, Li AH (2009) Algorithm based on Mahalanobis distance for soft faults detection of analog circuits[J]. Comput Meas Control 17(10):1886–1888

    Google Scholar 

  14. Starzyk JA, Pang J, Manetti S et al (2000) Finding ambiguity groups in low testability analog circuits. IEEE Trans Circ Syst I Fundam Theor Appl 47(8): 1125–1137. doi:10.1109/81.873868

    Google Scholar 

  15. Stenbakken GN, Souders TM, Stewart GM (1989) Ambiguity groups and testability [J]. IEEE Trans Instrum Meas 38(5):941–947

    Article  Google Scholar 

Download references

Acknowledgments

This research was supported in part by NSFC (60934002,61271035,61201009 & 61071029), Defence foundation scientific research fund (9140A17060411DZ0205), and specialized research fund for the DPHEC (20100185110004).

Author information

Authors and Affiliations

  1. School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, China

    Han Han, Houjun Wang, Shulin Tian & Na Zhang

Authors
  1. Han Han
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Houjun Wang
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Shulin Tian
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Na Zhang
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Han Han.

Additional information

Responsible Editor: H. Stratigopoulos

Rights and permissions

Reprints and permissions

About this article

Cite this article

Han, H., Wang, H., Tian, S. et al. A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis Distance. J Electron Test 29, 95–102 (2013). https://doi.org/10.1007/s10836-012-5342-z

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10836-012-5342-z

Keywords

Search

Navigation