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A Probabilistic Approach to Diagnose SETs in Sequential Circuits

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Abstract

In recent work, the error latching probability due to an SET is calculated for a single observable point, and this help in hardening the design. This paper utilizes a recently proposed probabilistic framework for SET propagation in order to diagnose the location and time of strike based on errors observed at multiple points. The proposed diagnostic framework requires a new approach to calculate the probability for SET propagation to multiple non-independent variables. It is shown experimentally that error appearances at multiple observable points help in SET diagnosis. The time performance of the proposed diagnostic framework is compared against an alternative implementation. This is particularly important in on-line diagnosis.

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Authors and Affiliations

  1. Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL, 62901, USA

    Sreenivas Gangadhar & Spyros Tragoudas

Authors
  1. Sreenivas Gangadhar
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  2. Spyros Tragoudas
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Correspondence to Sreenivas Gangadhar.

Additional information

Responsible Editor: M. Violante

This material is based upon work supported by the National Science Foundation under Grant no 0856039. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the authors and do not necessarily reflect the views of the National Science Foundation.

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Gangadhar, S., Tragoudas, S. A Probabilistic Approach to Diagnose SETs in Sequential Circuits. J Electron Test 29, 317–330 (2013). https://doi.org/10.1007/s10836-013-5361-4

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  • DOI: https://doi.org/10.1007/s10836-013-5361-4

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