Abstract
Dynamic logic families are commonly used in high speed applications, but they are susceptible to single event errors. This paper presents and evaluates three techniques of hardening dynamic logic—layout manipulation using charge sharing, addition of a feedback capacitor across the static inverter, and dual-rail domino logic with differential keepers. The layout-based design has better single event tolerance by sharing charge between NFET devices of the dynamic and static inverters; the design with a feedback capacitor makes the keeper more effective in recovering the hit node because of the increased propagation delay; the differential-keeper structure shows superior SET performance because the hit node could recover through the restoring path in the case of charge loss. These proposed designs along with the reference traditional keeper-based design were fabricated in a 130 nm technology node as shift register chains and then irradiated by heavy ion particles. Experimental results verified the mechanisms and effectiveness of these proposed designs.
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Acknowledgments
The University of Saskatchewan appreciates the support from Natural Science and Engineering Research Council of Canada, and CMC Microsystems. This work was supported in part by the Fundamental Research Funds for the Central Universities (26120132013B08714).
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Wang, HB., Li, ML., Chen, L. et al. Single Event Resilient Dynamic Logic Designs. J Electron Test 30, 751–761 (2014). https://doi.org/10.1007/s10836-014-5492-2
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DOI: https://doi.org/10.1007/s10836-014-5492-2