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Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal

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Abstract

This paper discusses the implementation possibilities for making Group Delay measurements of RF frequency converting devices using a standard RF semiconductor Automatic Test Equipment (ATE) that cannot be done using the standard S-parameter measurement due to the difference in frequency from the input to the output of the device. We discuss how using a chirp waveform modulating an RF generator can be used to sweep the frequency response of a RF frequency-converting device and how to produce such a modulation waveform in digital signal processing. We will describe how to implement a group delay test based on our previous work in the baseband domain and how to understand the errors pertaining to measuring a Radio Frequency Receiver. The measurement of the Group Delay of an RF front-end filter and post down convert IF filter will be demonstrated. We will also describe how to produce and maintain a stable frequency reference so that any down converted signal would be a true representation of the modulation signal applied to the RF Source and not corrupted by Phase Noise. We will show how to implement a group delay test based on our previous work in the baseband domain and how to understand the errors pertaining to measuring a radio frequency receiver. The measurement of the group delay of an RF mixer and pre and post down convert RF/IF filters will be demonstrated. The central goal of this paper is to demonstrate how a group delay test can be done at RF, with a frequency translating device, in a cheap and effective manner on semiconductor Automatic Test Equipment in a production environment.

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Acknowledgments

The authors would like to thank Professor Koji Asami, and Professor Hauro Kobayashi of Gunma University for encouraging and helping to develop of this technology.

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Authors and Affiliations

  1. ams AG, 8141, Premstaetten, Austria

    Peter Sarson

  2. Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, 376-8515, Japan

    Tomonori Yanagida & Kosuke Machida

Authors
  1. Peter Sarson
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  2. Tomonori Yanagida
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  3. Kosuke Machida
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Corresponding author

Correspondence to Peter Sarson.

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Responsible Editors: M. Barragan and K. Huang

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Sarson, P., Yanagida, T. & Machida, K. Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal. J Electron Test 34, 233–253 (2018). https://doi.org/10.1007/s10836-018-5708-y

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  • DOI: https://doi.org/10.1007/s10836-018-5708-y

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