Skip to main content
Log in

Real-time defect detection network for polarizer based on deep learning

  • Published:
Journal of Intelligent Manufacturing Aims and scope Submit manuscript

Abstract

Quality analysis of the polarizer of a production line can be performed using image processing technology. The existing method of detecting defective images based on deep learning can ensure accurate classification; however, its detection speed is low, the model requires a large amount of memory, and it is difficult to meet the real-time requirements of online detection systems when hardware resources are limited. Therefore, in this study a lightweight polarizer defect detection network, called DDN, was developed based on deep learning. First, a parallel module was designed to build the network. This module has two main advantages. First, it mixes different convolution template sizes, and can fuse the features of different scales and extract more defect features than the traditional convolution layer. Second, depthwise separable convolution is used to replace full convolution in this module, which significantly reduces the number of parameters and the multiply-accumulate operations. Finally, a global average pooling (GAP) layer is used instead of a fully connected layer. The GAP layer has no parameters to optimize, which substantially reduces the number of network parameters. Experimental results show that the proposed method is better than existing methods in terms of classification speed, precision, and memory consumption for polarizer detection, and can satisfy real-time requirements.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6: a

Similar content being viewed by others

References

  • Ahonen, T., Hadid, A., & Pietikainen, M. (2006). Face description with local binary patterns: Application to face recognition. IEEE Transactions on Pattern Analysis and Machine Intelligence, 12, 2037–2041.

    Article  Google Scholar 

  • Bay, H., Tuytelaars, T., & Van Gool, L. (2006). Surf: Speeded up robust features. In Proceedings of European conference on computer vision (pp. 404-417). Berlin, Heidelberg: Springer.

  • Cha, Y. J., Choi, W., & Büyüköztürk, O. (2017). Deep learning-based crack damage detection using convolutional neural networks. Computer-Aided Civil Infrastructure Engineering, 32(5), 361–378.

    Article  Google Scholar 

  • Cheng, J. C. P., & Wang, M. (2018). Automated detection of sewer pipe defects in closed-circuit television images using deep learning techniques. Automation in Construction, 95, 155–171.

    Article  Google Scholar 

  • Chollet, F. (2017). Xception: Deep learning with depthwise separable convolutions. In Proceedings of the IEEE conference on computer vision and pattern recognition (pp. 1251–1258).

  • Dalal, N., & Triggs, B. (2005). Histograms of oriented gradients for human detection. In Proceedings of the international conference on computer vision and pattern recognition. (CVPR’05) (Vol. 1, pp. 886–893). IEEE Computer Society.

  • Deng, Y., Xu, S., Chen, H., et al. (2018). Inspection of extremely slight aesthetic defects in a polymeric polariser using the edge of light between black and white stripes. Polymer Testing, 65, 169–175.

    Article  Google Scholar 

  • Deng, Y., Xu, S., & Lai, W. (2017). A novel imaging-enhancement-based inspection method for transparent aesthetic defects in a polymeric polariser. Polymer Testing, 61, 333–340.

    Article  Google Scholar 

  • Girshick, R., Donahue, J., Darrell, T., et al. (2014). Rich feature hierarchies for accurate object detection and semantic segmentation. In Proceedings of the IEEE conference on computer vision and pattern Recognition (pp. 580–587).

  • Han, S., Mao, H., & Dally, W.J. (2015). Deep compression: Compressing deep neural networks with pruning, trained quantization and Huffman coding. arXiv preprint arXiv:1510.00149,

  • Han, S., Pool, J., Tran, J., et al. (2015). Learning both weights and connections for efficient neural network. In Advances in neural information processing systems (pp. 1135–1143).

  • He, K., Zhang, X., Ren, S., et al. (2016). Deep residual learning for image recognition. In Proceedings of the IEEE conference on computer vision and pattern recognition (pp. 770–778).

  • Howard, A. G., Zhu, M., Chen, B., et al. (2017). Mobilenets: Efficient convolutional neural networks for mobile vision applications. arXiv preprint arXiv:1704.04861,

  • Iandola, F. N., Han, S., Moskewicz, M. W., et al. (2016). SqueezeNet: AlexNet-level accuracy with 50× fewer parameters and < 0.5 MB model size. arXiv preprint arXiv:1602.07360.

  • Krizhevsky, A., Sutskever, I., & Hinton, G. E. (2012). Imagenet classification with deep convolutional neural networks. In Advances in neural information processing systems (pp. 1097–1105).

  • Lai, W., Zeng, X., He, J., et al. (2016). Aesthetic defect characterization of a polymeric polariser via structured light illumination”. Polymer Testing, 53, 51–57.

    Article  Google Scholar 

  • Lin, M., Chen, Q., & Yan, S. (2013). Network in network. arXiv preprint arXiv:1312.4400,

  • Lin, H., Li, B., Wang, X., et al. (2019). Automated defect inspection of LED chip using deep convolutional neural network. Journal of Intelligent Manufacturing, 30(6), 2525–2534.

    Article  Google Scholar 

  • Long, J., Shelhamer, E., & Darrell, T. (2015). Fully convolutional networks for semantic segmentation. In Proceedings of the IEEE conference on computer vision and pattern recognition (pp. 3431–3440).

  • Lowe, D. G. (2004). Distinctive image features from scale-invariant keypoints. International Journal of Computer Vision, 60(2), 91–110.

    Article  Google Scholar 

  • Ma, L., Xie, W., & Zhang, Y. (2019). Blister defect detection based on convolutional neural network for polymer lithium–ion battery. Applied Sciences, 9(6), 1085.

    Article  Google Scholar 

  • Manjula, C., & Florence, L. (2018). Deep neural network based hybrid approach for software defect prediction using software metrics. Cluster Computing, 2018, 1–17.

    Google Scholar 

  • Mery, D., & Arteta, C. (2017). Automatic defect recognition in X-ray testing using computer vision. In 2017 IEEE winter conference on applications of computer vision (WACV) (pp. 1026–1035). IEEE.

  • Oquab, M., Bottou, L., Laptev, I., et al. (2014). Learning and transferring mid-level image representations using convolutional neural networks. In Proceedings of the IEEE conference on computer vision and pattern recognition (pp. 1717–1724).

  • Razavian, A.S., Azizpour, H., Sullivan, J., et al. (2014). CNN features off-the-shelf: An astounding baseline for recognition. In Proceedings of the IEEE conference on computer vision and pattern recognition workshops (pp. 806–813).

  • Ren, R., Hung, T., & Tan, K. C. (2017). A generic deep-learning-based approach for automated surface inspection. IEEE Transactions on Cybernetics, 48(3), 929–940.

    Article  Google Scholar 

  • Simonyan, K., & Zisserman, A. (2014). Very deep convolutional networks for large-scale image recognition. arXiv preprint arXiv:1409.1556.

  • Szegedy, C., Liu, W., Jia, Y., et al. (2015). Going deeper with convolutions. In Proceedings of the IEEE conference on computer vision and pattern recognition (pp. 1–9).

  • Szegedy, C., Toshev, A., & Erhan, D. (2013). Deep neural networks for object detection. In Advances in neural information processing systems (pp. 2553–2561).

  • Yen, H. N., & Syu, M. J. (2015). Inspection of polariser tiny bump defects using computer vision. In Consumer electronics (ICCE). 2015 IEEE international conference (pp. 525–527). Las Vegas, NV: IEEE.

  • Zhang, X., Zhou, X., Lin, M., et al. (2018). Shufflenet: An extremely efficient convolutional neural network for mobile devices. In Proceedings of the IEEE conference on computer vision and pattern recognition (pp. 6848–6856).

Download references

Acknowledgements

This work is supported by the National Natural Science Foundation of China (61672373), STITSX (201705D131025), 1331KITSX, CiCi3DP, the Fund for Shanxi Key Subjects Construction, the Shanxi Key Research and Development Plan Project (No. 201703D121028-1), the Key Research and Development Plan of Shanxi Province (No. 201703D111027), Shanxi Key Laboratory of Advanced Control and Intelligent Information System (201805D111001), Engineering Research Center for Key Technologies of Flat Panel Display Intelligent Manufacturing Equipment, Key Research and Development Plan of Shanxi Province (Grant Nos. 201703D111027, 201703D111023, 201903D121130), Taiyuan University of Science And Technology Scientific Research Initial Funding (TYUSTSRIF, No. 20192014), and Applied Basic Research Programs of Shanxi Province (201901D111265).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Zhiyi Sun.

Additional information

Publisher's Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Liu, R., Sun, Z., Wang, A. et al. Real-time defect detection network for polarizer based on deep learning. J Intell Manuf 31, 1813–1823 (2020). https://doi.org/10.1007/s10845-020-01536-7

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10845-020-01536-7

Keywords

Navigation