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Trustworthy Scan Design and Testability Using Obfuscation and Logic Locking Scheme for Wireless Network Application

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Abstract

The wireless network (WN) has become an integral part of the living habits of human beings. Most of the crypto chips are broadly utilized in WN application to assure the security of information. The functional correctness of cryptographic devices should be verified to authenticate the precision of the secrecy of the information. In the IC industry correctness of the wireless sensing device can be verified by scan design-based testing. The scan chain-based testing is the most popularly used testing technique due to its increased fault coverage and improved test quality. It also acts as a hacking tool and recovers sensitive data through side-channel attacks like power, time, or hamming distance. This paper presents the state-of-art-of secure mechanism to protect the scan chain from the side-channel attack using the obfuscation technique and logic locking Scheme. The proposed methodology provides direct access to internal data to the authorized test engineer. Although, the security synthesis creates a controllable confusion between the reverse-engineered netlist and the original design. The proposed secure design protects the design from a hamming distance-based attack, brute force attack, and hill-climbing attack. Then evaluate the security and overhead of the suggested approach using ISCAS’89 and ITC’99 test circuits.

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Authors and Affiliations

  1. Department of Electronics and Communication Engineering, Amrita School of Engineering, Amrita Vishwa Vidyapeetham, Coimbatore, India

    M. I. Shiny & M. Nirmala Devi

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  1. M. I. Shiny
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  2. M. Nirmala Devi
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Correspondence to M. I. Shiny.

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Shiny, M.I., Nirmala Devi, M. Trustworthy Scan Design and Testability Using Obfuscation and Logic Locking Scheme for Wireless Network Application. Mobile Netw Appl 27, 1000–1018 (2022). https://doi.org/10.1007/s11036-021-01857-8

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