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320 Gb/s all-optical XOR gate using semiconductor optical amplifier-Mach–Zehnder interferometer and delayed interferometer

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Abstract

All-optical exclusive OR (XOR) gate with semiconductor optical amplifier (SOA)-Mach–Zehnder interferometer (MZI) and delayed interferometer (DI) is demonstrated at 320 Gb/s through numerical simulation and analysis. The performance of the XOR gate is investigated and evaluated against the quality factor (QF). The obtained results indicate that placing the DI in series with the SOA-MZI renders acceptable QF of the XOR outcome at the target data rate, as opposed to the case without the DI, where the achievement of the same goal is not possible.

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Authors and Affiliations

  1. The Guo China-US Photonics Laboratory, Changchun Institute of Optics, Fine Mechanics, and Physics, Chinese Academy of Sciences, Changchun, 130033, China

    Amer Kotb & Chunlei Guo

  2. Department of Physics, Faculty of Science, University of Fayoum, Fayoum, 63514, Egypt

    Amer Kotb

  3. Lightwave Communications Research Group, Department of Electrical and Computer Engineering, School of Engineering, Democritus University of Thrace, 67100, Xanthi, Greece

    Kyriakos E. Zoiros

  4. The Institute of Optics, University of Rochester, Rochester, NY, 14627, USA

    Chunlei Guo

Authors
  1. Amer Kotb
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  2. Kyriakos E. Zoiros
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  3. Chunlei Guo
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Correspondence to Amer Kotb or Chunlei Guo.

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Kotb, A., Zoiros, K.E. & Guo, C. 320 Gb/s all-optical XOR gate using semiconductor optical amplifier-Mach–Zehnder interferometer and delayed interferometer. Photon Netw Commun 38, 177–184 (2019). https://doi.org/10.1007/s11107-019-00844-0

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  • DOI: https://doi.org/10.1007/s11107-019-00844-0

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