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Design and reliability analysis of fault-tolerant shuffle exchange gamma logical neighborhood interconnection network

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Abstract

Multistage interconnection networks are used as a medium for interconnecting processors and memories in multiprocessor systems. Multistage interconnection networks are an effective substitute for crossbar switches, used in telephone network systems and parallel computers, due to their low cost, better performance and easy maintainability. In this paper, we propose new fault-tolerant hybrid multistage interconnection networks obtained from shuffle exchange gamma interconnection network (SEGIN) and logical neighborhood network named as shuffle exchange gamma logical neighborhood interconnection network (SEGLNIN). We evaluated the performance of SEGLNIN in terms of disjoint paths, reliability and hardware cost and compared it with some well-known MINs like shuffle exchange network (SEN), shuffle exchange network with one extra stage (SEN +) and shuffle exchange network with two extra stages (SEN + 2), SEGIN-1, and SEGIN-2. The results illustrate that the performance of the proposed SEGLNIN is better than that of the compared networks in terms of reliability and disjoint paths.

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Acknowledgements

Authors acknowledge the National Institute of Technology Jamshedpur, India, for providing the research opportunity and facilities.

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Authors and Affiliations

  1. Department of Electronics and Communication Engineering, National Institute of Technology Jamshedpur, Jamshedpur, Jharkhand, India

    Amit Prakash

  2. Department of Computer Applications, National Institute of Technology Jamshedpur, Jamshedpur, Jharkhand, 831014, India

    Dilip Kumar Yadav

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  1. Amit Prakash
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  2. Dilip Kumar Yadav
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Correspondence to Dilip Kumar Yadav.

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Prakash, A., Yadav, D.K. Design and reliability analysis of fault-tolerant shuffle exchange gamma logical neighborhood interconnection network. J Supercomput 75, 7934–7951 (2019). https://doi.org/10.1007/s11227-019-02929-z

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