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Flip-flops soft error rate evaluation approach considering internal single-event transient

考虑内部 SET的触发器软错误率评估方法

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Abstract

The internal single-event transient (SET) induced upset in flip-flops is becoming significant with the increase of the operating frequency. However, the conventional soft error rate (SER) evaluation approach could only produce an approximate upset prediction result caused by the internal SET. In this paper, we propose an improved SER evaluation approach based on Monte Carlo simulation. A novel SET-based upset model is implemented in the proposed evaluation approach to accurately predict upsets caused by the internal SET. A test chip was fabricated in a commercial 65 nm bulk process to validate the accuracy of the improved SER evaluation approach. The predicted single-event upset cross-sections are consistent with the experimental data.

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Authors and Affiliations

  1. College of Computer Science, National University of Defense Technology, Changsha, 410073, China

    RuiQiang Song, ShuMing Chen, YiBai He & YanKang Du

  2. Science and Technology on Parallel and Distributed Processing Laboratory, Changsha, 410073, China

    ShuMing Chen

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  1. RuiQiang Song
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  2. ShuMing Chen
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  3. YiBai He
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  4. YanKang Du
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Correspondence to ShuMing Chen.

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Song, R., Chen, S., He, Y. et al. Flip-flops soft error rate evaluation approach considering internal single-event transient. Sci. China Inf. Sci. 58, 1–12 (2015). https://doi.org/10.1007/s11432-014-5260-z

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  • DOI: https://doi.org/10.1007/s11432-014-5260-z

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