Skip to main content
Log in

Cost-effective SET-tolerant clock distribution network design by mitigating single event transient propagation

  • Highlight
  • Published:
Science China Information Sciences Aims and scope Submit manuscript

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

References

  1. Chellappa S, Clark L T, Holbert K E. A 90-nm radiation hardened clock spine. IEEE Trans Nucl Sci, 2012, 59: 1020–1026

    Article  Google Scholar 

  2. Seifert N, Shipley P, Pant M D, et al. Radiationinduced clock jitter and race. In: Proceedings of the 43rd Annual International Reliability Physics Symposium, San Jose, 2005. 215–222

    Google Scholar 

  3. Dash R, Garg R, Khatri S P, et al. SEU hardened clock regeneration circuits. In: Proceedings of the 10th International Symposium on Quality of Electronic Design, San Jose, 2009. 806–813

    Google Scholar 

  4. Chipana R, Kastensmidt F L. SET susceptibility analysis of clock tree and clock mesh topologies. In: Proceedings of the IEEE Computer Society Annual Symposium on VLSI, Tampa, 2014. 559–564

    Google Scholar 

  5. Chipana R, Kastensmidt F L, Tonfat J, et al. SET susceptibility estimation of clock tree networks from layout extraction. In: Proceedings of the 13th Latin American IEEE Test Workshop, Quito, 2012. 1–6

    Google Scholar 

  6. Mallajosyula A, Zarkesh-Ha P. A robust single event upset hardened clock distribution network. In: Proceedings of the International Integrated Reliability Workshop, S. Lake Tahoe, 2008. 121–124

    Google Scholar 

  7. Mavis D G, Eaton P H. SEU and SET modeling and mitigation in deep submicron technologies. In: Proceedings of the International Reliability Physics Symposium, Phoenix, 2007. 293–305

    Google Scholar 

Download references

Acknowledgments

This work was supported by National Natural Science Foundation of China (Grant Nos. 61376109, 61434007).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Shuming Chen.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Hao, P., Chen, S., Huang, P. et al. Cost-effective SET-tolerant clock distribution network design by mitigating single event transient propagation. Sci. China Inf. Sci. 60, 108401 (2017). https://doi.org/10.1007/s11432-016-9041-5

Download citation

  • Received:

  • Accepted:

  • Published:

  • DOI: https://doi.org/10.1007/s11432-016-9041-5

Navigation