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Defect characterization of amorphous silicon thin film solar cell based on low frequency noise

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References

  1. Fine B V, Bakker J P R, Dijkhuis J I. Long-range potential fluctuations and 1/f noise in hydrogenated amorphous silicon. Phys Rev B, 2003, 12: 409–412

    Google Scholar 

  2. He L, Chen H, Sun P, et al. Single event upset rate modeling for ultra-deep submicron complementary metal-oxide-semiconductor devices. Sci China Inf Sci, 2016, 59: 042402

    Article  Google Scholar 

  3. Xiong S Z, Zhu M F. Fundamentals and Applications of Solar Cells. Beijing: Science Press, 2009

    Google Scholar 

  4. Zhuang Y Q, Sun Q. Noise and its Minimizing Technology in Semiconductor Devices. Beijing: National Defense Industry Press, 1993

    Google Scholar 

  5. Simoen E, Cretu B, Fang W, et al. Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices. Solid State Phenom, 2015, 242: 449–458

    Article  Google Scholar 

  6. Liu E K, Zhu B S, Luo J S. Semiconductor Physics. Beijing: National Defense Industry Press, 2010

    Google Scholar 

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Acknowledgements

This work was supported by National Natural Science Foundation of China (Grant No. 61106062), Fundamental Research Funds for the Central Universities (Grant No. JB181409), and Ankang College Youth Fund (Grant No. 2017AYQN06).

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Authors and Affiliations

  1. School of Advanced Materials and Nanotechnology, Xidian University, Xi’an, 710126, China

    Linna Hu, Liang He, Hua Chen, Ying Hu, Hongmei Ma, Dandan Guo & Yu Qin

  2. School of Electronic and Information Engineering, Ankang University, Ankang, 725000, China

    Xiaofei Jia

Authors
  1. Linna Hu
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  2. Liang He
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  3. Hua Chen
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  4. Xiaofei Jia
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  5. Ying Hu
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  6. Hongmei Ma
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  7. Dandan Guo
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  8. Yu Qin
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Correspondence to Liang He.

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Hu, L., He, L., Chen, H. et al. Defect characterization of amorphous silicon thin film solar cell based on low frequency noise. Sci. China Inf. Sci. 61, 069403 (2018). https://doi.org/10.1007/s11432-017-9360-7

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  • DOI: https://doi.org/10.1007/s11432-017-9360-7

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