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This work was supported by the project of City University of Hong Kong (Grant No. 9231249).
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Wong, H., Dong, S. & Chen, Z. Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices. Sci. China Inf. Sci. 65, 129403 (2022). https://doi.org/10.1007/s11432-020-3197-8
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DOI: https://doi.org/10.1007/s11432-020-3197-8