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Acknowledgments
The authors would like to gratefully acknowledge the help of the laboratory. This work was supported by National Natural Science Foundation of China NSFC grants 11472303 and 11402298.
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Zhang, X., Shen, C., Cheng, P. et al. An image-processing based method for the measurement of the film thickness of a swirl atomizer. J Vis 20, 1–5 (2017). https://doi.org/10.1007/s12650-016-0370-x
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DOI: https://doi.org/10.1007/s12650-016-0370-x