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“Defect Root-Cause Analysis and 1+n Procedure” technique to improve software quality

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International Journal of System Assurance Engineering and Management Aims and scope Submit manuscript

Abstract

A “Defect Root-Cause Analysis and 1+n Procedure” is a technique designed to analyze specific root-causes of a software defect and detect defects of the same kind which are introduced due to the same root-cause and overlooked during the software design review and testing. This paper describes the “Defect Root-Cause Analysis and 1+n Procedure” technique in detail and reports a method of its application, real world example, and its contribution to software quality improvement. The characteristics of the “Defect Root-Cause Analysis and 1+n Procedure” technique is also discussed.

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Acknowledgments

The authors would like to express my deep gratitude to Mr. Yamamoto, Operating Officer, NEC Corporation for his great cooperation.

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Authors and Affiliations

  1. IT Software Operations Unit, NEC Corporation, 1-10, Nisshin-cho, Fuchu, Tokyo, 183-8501, Japan

    Naomi Honda

  2. Department of Social Management Engineering, Graduate School of Engineering, Tottori University, Tottori-shi, 680-8552, Japan

    Shigeru Yamada

Authors
  1. Naomi Honda
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  2. Shigeru Yamada
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Correspondence to Naomi Honda.

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Honda, N., Yamada, S. “Defect Root-Cause Analysis and 1+n Procedure” technique to improve software quality. Int J Syst Assur Eng Manag 3, 111–121 (2012). https://doi.org/10.1007/s13198-012-0118-5

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  • DOI: https://doi.org/10.1007/s13198-012-0118-5

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