Fault generation model and mental stress effect analysis

doi:10.1016/0164-1212(94)90093-0

Journal of Systems and Software

Volume 26, Issue 1, July 1994, Pages 31-42

https://doi.org/10.1016/0164-1212(94)90093-0 Get rights and content

Abstract

Various technologies for improving software reliability have been developed and widely used. These tech- nologies, however, mainly concern how to eliminate faults generated in earlier phases. Our objective is to go one step further and determine how to avoid generating faults. This article first describes fault generation models based on a software development model. Those models are then shown to be consistent with the results of an analysis of data collected from fault reports and thorough interviews with software developers, that is, designers and programmers. The relationships among the various error factors and fault classes were also obtained through data analysis. The results clearly show that mental stress and human nature are the largest causes of developer-generated faults. Finally, the number of faults that could have been avoided is estimated.

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Fault generation model and mental stress effect analysis

Abstract

Tailoring the software process to project goals and environment

An Analysis of Error and Their Causes in System Programs

IEEE Trans. Software Eng.

Mental Workload of Software Engineers

Structural way of thinking as applied to improvement process