Microelectronics ReliabilityVolume 42, Issues 9–11, September–November 2002, Pages 1457-1460Simulative prediction of the resistance change due to electromigration induced void evolutionAuthor links open overlay panelHajdin Ceric, Siegfried SelberherrShow moreShareCitehttps://doi.org/10.1016/S0026-2714(02)00169-5Get rights and contentFirst page previewClick to open first page previewView PDFRecommended articlesReferences (0)Cited by (0)View full textCopyright © 2002 Elsevier Science Ltd. All rights reserved.