Detection and identification of input/output stuck-at and bridging faults in combinational and sequential VLSI networks by universal tests*
References (17)
- et al.
Polynomially complete fault detection problems
IEEE Trans. Comput.
(1975) - et al.
The complexity of design automation problems
Universal tests for detection of input/output stuck-at and bridging faults
IEEE Trans. Comput.
(1983)Universal tests detecting input/output faults in almost all devices
- et al.
Bridging and stuck-at faults
IEEE Trans. Comput.
(1974)- et al.
Undetectability of bridging faults and validity of stuck-at fault test set
IEEE Trans. Comput.
(1980) - et al.
Test generation for microprocessors
IEEE Trans. Comput.
(1980)
There are more references available in the full text version of this article.
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This work was partially supported by the National Science Foundation under Grant MCS8021262.
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Present address: Department of Computers, Systems and Electrical Engineering, College of Engineering, Boston University, Boston, MA 02215, U.S.A.
Copyright © 1983 Published by Elsevier B.V.