Information and Software TechnologyVolume 81, January 2017, Pages 1-2EditorialSpecial issue on Mutation TestingAuthor links open overlay panelMike Papadakis a, René Just bShow moreShareCitehttps://doi.org/10.1016/j.infsof.2016.08.003Get rights and contentRecommended articlesReferences (0)Cited by (0)View full text© 2016 Elsevier B.V. All rights reserved.