Elsevier

Microelectronics Journal

Volume 38, Issue 2, February 2007, Pages 259-261
Microelectronics Journal

The dielectric constant of materials effect the property of the OLED

https://doi.org/10.1016/j.mejo.2006.11.002Get rights and content

Abstract

Several important materials have been used for the electron injection layer (EIL) of the organic light-emitting devices (OLEDs), such as LiF, NaCl, NaF, Al2O3, SiO2, Si3N4, MgO, etc. LiF is the most usually used in OLED among these materials for its performance in OLED. The dielectric constant of LiF, NaCl, NaF is 9.036, 5.895 and 5.072, respectively, at 300 K [J. Fontanella, C. Andeen, D. Schuele, Phys. Rev. B 6 (1972) 582]. The thin film of these insulting layers here supply a very strong electric field to enhance the electrons injection and limit the holes injection to the emitting layer (EL). Then we kept the balance of the injected electrons and the holes, and then we got the excellent performing OLEDs.

References (16)

  • J. Lee et al.

    Appl. Phys. Lett.

    (2002)
  • J. Fontanella et al.

    Phys. Rev. B

    (1972)
  • C.W. Tang et al.

    Appl. Phys. Lett.

    (1987)
  • N.C. Greenham et al.

    Nature (London)

    (1993)
  • J. Pommerehne et al.

    Synth. Met.

    (1996)
  • L.S. Huang et al.

    Appl. Phys. Lett.

    (1997)
  • S. Naka et al.

    Appl. Phys. Lett.

    (2000)
  • D. Grozea et al.

    Appl. Phys. Lett.

    (2002)
There are more references available in the full text version of this article.

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