Impact of semiconductors material on IR Laser Stimulation signal
References (6)
- K. Nikawa and S. Inoue, New Capabilities of OBIRCH Method for Fault Localization and Defect Detection, Proc. Of Sixth...
- et al.
Reliability defect monitoring with thermal laser stimulation: biased versus unbiased
Microelectronic reliability
(2002) - A. Firiti, F. Beaudoin, G. Haller, P. Perdu, D. Lewis and P. Fouillat, Short defect characterization based on TCR...
There are more references available in the full text version of this article.
Cited by (2)
Scanning picosecond tunable laser system for simulating MeV heavy ion-induced charge collection events as a function of temperature
2008, Review of Scientific InstrumentsDynamic thermal laser stimulation theory and applications
2006, IEEE International Reliability Physics Symposium Proceedings
Copyright © 2005 Elsevier Ltd. All rights reserved.