Thermo-mechanical reliability of a multi-walled carbon nanotube-incorporated solderable isotropic conductive adhesive
Graphical abstract
Introduction
Electrically conductive adhesives (ECAs) with non-fusible organic or non-organic fillers have been widely used as an alternative to lead-free solder materials in the microelectronic packaging industry due to their potential advantages such as low processing temperature, high resolution capabilities, more flexible and simpler processing, and compatibility with non-solderable materials [1], [2], [3]. However, non-fusible filler-filled ECAs form a conduction path through the physical–mechanical contact of the conduction fillers between corresponding metallization surfaces during the curing process. Due to this conduction mechanism, the non-fusible filler-filled ECAs have critical limitations when compared with metallurgical interconnections using soldering techniques. These shortcomings include low and unstable electrical and thermal conductivities, increased contact resistance, and low impact and joint strength [4], [5]. To overcome the limitations of non-fusible filler-filled ECA techniques, solderable isotropic conductive adhesives (SICAs) with a polymer matrix (with reduction capabilities) and fusible low-melting-point alloy (LMPA) fillers have been investigated [6], [7]. SICAs can achieve excellent interconnection properties, such as low and stable electrical performance and high mechanical bonding strength, by the formation of metallurgical conduction path in the molten LMPA fillers.
Additionally, in previous works, we formulated SICAs that were incorporated with carbon nanotubes (CNTs) as a reinforcement material to improve the interconnection properties of SICAs. We also developed an interconnection mechanism for these materials, as shown in Fig. 1 [8], [9]. CNTs are considered to be ideal nanofiller materials for the improvement of polymer composites because of their physical properties (e.g., their novel structure, high intrinsic mechanical strength, and electrical and thermal conductivities) [10]. As can be seen in the figure, the metallurgical conduction path is formed by the flow-coalescence-wetting behaviors of molten LMPAs between the corresponding electrodes, and the simultaneous movement of the polymer composite outside of the conduction path region. At this time, the covalently bonded CNTs, with epoxides of polymer composites, moved outside of the conduction path via the polymer flow. The interconnection properties of SICAs can be enhanced compared to SICAs without CNTs due to the outstanding physical properties of CNTs within the polymer composite region.
When developing an interconnection material to apply to an electronic package device, the thermo-mechanical reliability properties of the interconnection material should be carefully considered to ensure reliable performance of the electronic packages. Electronic packages are composed out of various package materials with dissimilar coefficients of thermal expansion (CTEs). When the electronic packages are exposed to various environments, such as repetitive temperature change, high humidity by power consumption, or the external environment, high interfacial stresses can be generated in the package joints due to the CTE mismatch between the package materials [11]. Most fatigue failures can be attributed to thermo-mechanical stresses in the package joints [12]. If these stresses exceed the critical value, interfacial delamination and fracture will occur, and the functionality of the system will be destroyed [13].
In this study, to examine the influence of multi-walled carbon nanotubes (MWCNTs) on the thermo-mechanical reliability properties of SICAs, two types of SICAs (with and without MWCNTs) were prepared. Thermal shock (TS) and high-temperature and high-humidity (HTHH) tests were performed. The electrical and mechanical reliability properties of SICA assemblies were investigated and compared during reliability testing. In addition, the interfacial microstructure and fracture surface were analyzed.
Section snippets
Materials
For the formulation of SICAs, diglycidyl ether of bisphenol A (DGEBA, Kukdo Chemical, Korea) was used as the base resin. 4,4′-diaminodiphenylmethane (DDM, TCI Korea Co., Korea) and boron trifluoro-mono-ethylamine (BF3MEA, Wako Pure Chemical, Japan) were used as the curing agent and catalyst, respectively. Carboxylic acid (Aldrich Chem. Co., USA) was used as the reductant to eliminate the oxide layer on the LMPA and metallization surface. The LMPA filler (Sn-58Bi solder powder, melting
Reliability properties of MWCNT-incorporated SICA assemblies
In this study, to examine the effect of MWCNT incorporation on the reliability properties of SICAs, TS and HTHH tests were conducted for QFP assemblies using SICAs with and without MWCNTs. Fig. 3 shows the cross-sectional FE-SEM images of the conduction path between the QFP lead and the PCB metallization (Fig. 3(a), (c)) and the fracture surface morphologies after the 45° pull test (Fig. 3(b), (d)) of the QFP joint before reliability testing. As can be seen in Fig. 3(a) and (c), the QFP joints
Conclusion
To investigate the influence of MWCNTs on the reliability properties of SICAs, two types of SICAs (without MWCNTs (SICA 1) and with MWCNTs (SICA 2)) were formulated. The reliability properties of these samples were investigated by TS and HTHH testing. SICA assemblies showed stable electrical reliability properties under harsh environments; this stability is caused by the formation of excellent metallurgical interconnection between the corresponding metallizations by the molten LMPA fillers.
Acknowledgments
This research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT and future Planning (2014007164).
References (36)
- et al.
Electrical reliability of electrically conductive adhesive joints: dependence on curing condition and current density
Microelectron. J.
(2001) - et al.
Recent advances on anisotropic conductive adhesives (ACAs) for flat panel displays and semiconductor packaging applications
Int. J. Adhes. Adhes.
(2006) - et al.
Electro-conductive adhesives for high density package and flip-chip interconnections
Microelectron. Reliab.
(2000) - et al.
Electrical and mechanical properties of electrically conductive adhesives from epoxy, micro-silver flakes, and nano-hexagonal boron nitride particles after humid and thermal aging
Int. J. Adhes. Adhes.
(2013) - et al.
Environmental aging effects on the durability of electrically conductive adhesive joints
Int. J. Adhes. Adhes.
(2003) - et al.
Characteristics of solderable electrically conductive adhesives (ECAs) for electronic packaging
Microelectron. Reliab.
(2012) - et al.
Influence of the polymer structure and nanotube concentration on the conductivity and rheological properties of polyethylene/CNT composites
Phys. E.
(2008) - et al.
Reliability study of Sn–Ag–Cu–Ce soldered joints in quad flat packages
Microelectron. Reliab.
(2010) - et al.
Solder joint fatigue models: review and applicability to chip scale packages
Microelectron. Reliab.
(2000) - et al.
A multi-scale approach for investigation of interfacial delamination in electronic packages
Microelectron. Reliab.
(2010)
Role of direct covalent bonding in enhanced heat dissipation property of flexible graphene oxide–carbon nanotube hybrid film
Thin Solid Films
Dispersion and functionalization of carbon nanotubes for polymer-based nanocomposites: a review
Compos. A: Appl. Sci. Manuf.
The effect of interfacial chemistry on molecular mobility and morphology of multiwalled carbon nanotubes epoxy nanocomposite
Polymer
Fundamental aspects of nano-reinforced composites
Compos. Sci. Technol.
Mixed mode brittle fracture in epoxy/multi-walled carbon nanotube nanocomposites
Eng. Fract. Mech.
Fracture behavior of nanotube-polymer composites: insights on surface roughness and failure mechanism
Compos. Sci. Technol.
Kirkendall effect studies in copper–tin diffusion couples
Scr. Metall.
Investigation of interfacial reactions between Sn–5Bi solder and Cu substrate
J. Alloys Compd.
Cited by (5)
Electrical and mechanical reliability and failure mechanism analysis of electrically conductive adhesives
2023, Microelectronics ReliabilityA systematic literature review: The effects of surface roughness on the wettability and formation of intermetallic compound layers in lead-free solder joints
2022, Journal of Manufacturing ProcessesCitation Excerpt :The alloying element could be another influence on the surface roughness of lead-free solder alloys. Examples include Zn [85–87], ZnO [87–89], Ag [90], Bi [59], In [91], Sb [92,93], Al2O3 [29,94], CeO2 [43,95], Si3N4 [50], graphene nanoplatelets (GNP) [96], multi-walled carbon nanotubes (MWCNT) [20,21,32], single-wall carbon nanotubes (SWCNT) [34], graphene nanosheets (GPNs) [97] and TiO2 [95]. Park et al. [98] investigated a study in which Cu-xZn wetting layers (0–43 wt%) were electroplated in a non-cyanide solution.
Ultrafast Photoinduced Interconnection of Metal-Polymer Composites for Fabrication of Transparent and Stretchable Electronic Skins
2020, ACS Applied Materials and InterfacesBall Grid Array Interconnection Properties of Solderable Polymer-Solder Composites with Low-Melting-Point Alloy Fillers
2017, Journal of Electronic Packaging, Transactions of the ASME