Elsevier

Microelectronics Reliability

Volume 79, December 2017, Pages 140-148
Microelectronics Reliability

Comparing the degradation effect of a ‘two-cell’ Supercapacitor-module with and without voltage equalization circuit(s) under experimental self-discharge and load cycling tests

https://doi.org/10.1016/j.microrel.2017.10.025Get rights and content

Abstract

The problem of over-voltage is common in SC modules under cycling conditions. To prevent this, the voltage equalization circuit is usually used as a tool to balance SC cells in a module to increase the life expectancy of the system. There is lack of detailed experimental analysis on its performance on degradation proximity testing. This paper therefore focuses on demonstrating the importance of voltage equalization circuits specifically on their performance in degradation proximity between two-cell modules experimentally. Three types of common active balancing equalization circuits were first tested and the best performing circuit was used to compare with a commercial Maxwell voltage equalization circuit under self-discharge and load cycling tests after 1115 h of continuous cycles under high temperature. The periodic capacitance (C) and ESR parameters calculated from charge-discharge characterization test results over 1115 h shows that the active balancing circuit produced a more even/balance parameter regression between each two-cells in a module over time.

Introduction

In recent years, supercapacitors have attracted significant attention, mainly due to their high power density, long lifecycle of charge/discharge with high currents, high efficiency, a wide range of operating temperatures, environmental friendliness with low maintenance, and high safety [1], [2]. These characteristics have made supercapacitors very competitive in various applications [3], [4]. Unfortunately, even with all their advantages, supercapacitors still pose some major concerns in their cycle-life and shell-life [5], [6], [7] which causes; (1) High cell voltage as a result of electrochemical decomposition of the electrolyte under certain conditions, which drastically reduce the life expectancy [8], [9], [10], [11], (2) Parallel leakage current causing fast self-discharge, limiting specific applications such as EV/HEV [1], [12].

The most common SC degradation factors are high temperature and high voltage [8]. Beside temperature and voltage, SCs also age by constant current charge/discharge cycles, undergoing power and drive cycles on SC module [13]. Like many electrochemical devices, the chemical reactions in SCs follow the Arrhenius law which states that higher temperature causes more rapid chemical reactions—for every 10 °C increase or each 100 mV, the chemical reaction rates double and the life is halved [8], [14], [15].

To study the degradation effects of SCs, constant current cycling tests known to induce self-heating through joule heating is carried out. Moreover, researchers' have found ways to speed up the degradation process in laboratories, one of which is, by introducing thermal effect to the cycling test, consequently reducing SC efficiency [8], [15], [16], [17]. After prolonged charge-discharge cycling under thermal operations, SCs demonstrate parasitic electrochemical reactions characterized by degradation modes which include; 100% increase in resistance (ESR), 20% decrease in capacitance [18], and microscopic phenomena such as gas evolution, increase in electrode mass, and local separation of the coating layer from the metallic collector.

In applications with high voltage system such as EVs, SC cells are connected in series forming a “module” to meet system power requirement [19]. In a system with more than one SC cell, the life expectancy decreases significantly even more than a single SC, as a result of over-voltage coupled with the possibility of uneven temperature distribution across the module. SC module failure mode is characterized by a “open/short circuit” with ESR rising to infinity, as a result of electrolyte loss over time due to the absence of voltage management circuit in the module [20]. This form of failure is impetuous and can jeopardise the whole system in an instance. Hence, to prevent imbalance and over voltage between SC cells in a module the presence of a voltage equalization circuit is inevitable to increase life expectancy of the system [21]. A cell voltage equalization circuit maximizes the performance, and life of SCs installed in series [22], [23], [24].

The advantage of a balancing/equalization circuit in a SC module is demonstrated in this paper. The literature on equalization circuits in SC modules is mostly mentioned in passing [22], [23], [24], as a tool needed to balance SC cells in a module. Most research papers such as [22], [23], [24] simply acknowledges the importance of equalization/balancing circuits and incorporates it accordingly to their respective research problems, therefore insight to its application as it affects the SCs in module; either for short-term or long-term operations is lacking. This paper, however experimentally demonstrates the importance of it, especially as it relates to degradation during cycling.

Comparability studies on two balancing circuits is used to validate the importance of voltage balancing with emphases on degradation proximity between two-cells in a modules.

Section snippets

Voltage equalizing circuit(s)

SC cell equalizing with different design techniques to complement application requirement is reported in [25], [26], [27], [28], [29]. SC balancing techniques are usually designed to the user's specification, which reflects its cost, flexibility, efficiency, and packaging implications.

Voltage equalization circuits have been described, for applications with batteries [30], [31], [32], [33]. However in SC applications, the principle behind the equalization circuits differs from battery

Experimental setup

A few SC cells from HC series (BCAP0025) Maxwell Technologies, USA [44], with a voltage rating of 2.7 V and a capacitance value of 25F, were used in carrying out all the experimental tests. The tests performed used SC modules of two cells each to study degradation behaviour. Fig. 4 is a block illustration of a SC module in a cycle mode with two charge/discharge circuit (consisting of an iteadunio Leonardo [46], Motomama motor shield [47], a voltage booster power supply for Fig. 4(a), while Fig. 4

Experimental test results and discussions

The experiments carried out in this paper are accelerated based tests under predefined conditions (as shown in Table 2) that yielded voltage profiles (shown in Fig. 6) at the initial test phase. As the experiment progresses, period characterization tests are carried out on the samples' to monitor their state of health (SOH). To effectively quantify and illustrate the degradation behaviour during cycling operations in this paper, Capacitances (C) and ESR results gotten from periodic

Conclusion

Although the experimental tests were carried out in a module arrangement, characterization tests were performed on individual cells. During characterization, all cells exhibited similar degradation modes except for the cycling test condition of cells W5&W6 connected without a voltage equalization circuit. At this test condition, an additional degradation mode known as the ‘open circuit failure mode’ was noticed just after 62,560 cycles without warning or display of any degrading signs. This

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