Elsevier

Neurocomputing

Volume 211, 26 October 2016, Pages 202-211
Neurocomputing

An improved SVM classifier based on double chains quantum genetic algorithm and its application in analogue circuit diagnosis

https://doi.org/10.1016/j.neucom.2015.12.131Get rights and content

Abstract

Support Vector Machine (SVM) classifier is widely used in analogue circuit diagnosis. However, the penalty parameter C and the kernel parameter γ of SVM classifier with the radial basis function (RBF) affect the classification performance seriously. A double-chains-quantum-genetic-algorithm (DCQGA) based method is proposed to optimize C and γ. In DCQGA, each chromosome carries two gene chains, and each of gene chains represents an optimization solution, which can accelerate the search process and help to find the global solution. Thereafter, the optimal parameters C and γ are obtained by optimizing the parameter searching process with DCQGA. Two common datasets named Iris and Wine from UCI Machine Learning Repository are used to test the performance of the presented SVM classifier. The simulation results illustrate that the population's best fitness and the classifying accuracy of the proposed DCQGA-SVM are higher than that of the Particle-Swarm-Optimization based SVM (PSO-SVM), the Quantum Genetic Algorithm based SVM (QGA-SVM) and the classifier based on grid search method (GS-SVM). Finally, the proposed DCQGA-SVM is applied to analogue circuit diagnosis, a Sallen–Key bandpass filter circuit and a four-opamp biquad high-pass filter are chosen as circuits under test (CUT). Wavelet packet analysis is performed to extract the fault features before classifying. The experimental results show that the SVM parameters selected by DCQGA-SVM contribute to higher diagnosis accuracy than other methods referred in this paper.

Introduction

Analogue circuits play a vital role in ensuring the availability of industrial systems. Unexpected circuit failure in such systems during field operation can have severe implications [1]. In the past several decades, analogue circuit diagnosis has become a very difficult task, though there are many efficiency methods have been presented at the system, board, chip level, such as the fuzzy analysis method [2], neural network [3], [4], [5], support vector machine (SVM) [6] and so on. The fuzzy analysis method needs long execution time or requiring too many test nodes. In view of the nonlinear case, document [7] presents a new method for solving fuzzy differential equations based on the reproducing kernel theory which can reduce the computing time effectively. Neural network and SVM are all based on intelligent fault dictionary. Compared with neural networks, SVM has simpler structure and needs smaller training group [8].

SVM is a pattern classification technique proposed by Vapnik and his co-workers. SVM has shown a good performance on high-dimensional data classification with small training group [9], [10], [11]. For its outstanding performance, SVM has been applied to many areas and got admirable results [12], [13], [14], [15], [16]. Also, SVM classifiers are very popular in analogue circuit diagnosis [17], [18], [19], [20]. However, SVM parameters have an important influence on the classification accuracy, such as the penalty parameter C and the kernel parameter γ for SVM with RBF kernel function, and it is difficult to find out the optimal SVM parameters. In recent researches, many kinds of optimization algorithms are used to choose the SVM parameters [21], [22], [23]. Document [21] introduces genetic algorithm (GA) to search the optimal parameters of SVM. Document [23] and [24] present two SVM parameters optimization methods based on Particle Swarm Optimization algorithm (PSO) and quantum genetic algorithm (QGA), respectively. PSO-SVM has a faster convergence speed and better diagnosis accuracy compared with GA-SVM for discrete optimization problems [25], but it is easy to fall into local optimum. The local optimum will result in a poor parameter combination and a bad classification accuracy.

In this paper, double chains quantum genetic algorithm (DCQGA) is introduced to optimize the penalty parameter C and the kernel parameter γ of SVM with RBF kernel function. GA is an optimization technique based on the principles of genetics and natural selection. The stochastic behaviour of GA cannot be ignored as it affects the search efficiency greatly [26]. DCQGA can be viewed as an improved GA algorithm [27]. Document [27] states that the chromosomes of DCQGA are encoded by quantum non-gates, updated by quantum rotation gates, and mutated by quantum non-gates. Since both probability amplitudes of qubits are regarded as genes, each chromosome carries two gene chains, and each of gene chains represents an optimization solution, which can accelerate search process. These improvements evidently enhance optimization efficiency [27].

The remainder of this paper is organized as follows. In Section 2, we review the SVM principle. In Section 3, we discuss the DCQGA theory. In Section 4, the proposed SVM classifier based on DCQGA is put forward. Experiment research is in Section 5. In Section 6, the conclusions are given.

Section snippets

Support vector machine review

SVM is based on the concept of decision planes that define decision boundaries. A decision plane is one that separates between a set of objects having different class memberships. For the linearly separable samples, the optimal classification hyperplane can separate the instances into two categories. For the linearly inseparable problems, the instances in the original space will be mapped into the high-dimensional feature space by using a nonlinearly transformation.

To construct an optimal

Double chains quantum genetic algorithm

DCQGA is a probability search algorithm to solve the continuous space optimization problems [27]. The algorithm uses quantum bits for coding chromosomes, probability amplitude for describing the feasible solution and quantum rotating gate for updating chromosomes [29].

If the solutions of n dimensional continuous space optimization are regard as points or vectors, and xi represents the parameters of the optimization problem needed to be optimized, the continuous optimization problems may be

The improved SVM classifier based on DCQGA

The DCQGA-based optimizing process of the penalty parameter C and the kernel parameter γ of SVM classifier with RBF can be demonstrated in Fig. 2, here we call it DCQGA-SVM.

The DCQGA-SVM optimizing process can be described as follows:

  • Step 1.

    Specimen collection: Collect the instances of different classes, then divide the instances into training group and testing group.

  • Step 2.

    Parameter initialization: Set the population size m, initial θ0, mutation probability Pm, crossover probability Pc, finite iterations L

Experiment research in analogue circuit diagnosis

The main steps of analogue circuit diagnosis based on DCQ GA-SVM are given in Fig. 7.

Conclusion

In this work, we have developed a DCQGA-SVM classifier. DCQGA-SVM improves the stability and classifying accuracy of SVM by optimizing the penalty parameter C and the kernel parameter γ of the SVM with RBF function based on DCQGA algorithm. Further, the application of DCQGA-SVM to analogue circuit diagnosis is proposed and verified. Results show that the accuracies of classification based on DCQGA-SVM are higher than that of the traditional SVM, the PSO-SVM and the QGA-SVM.

Acknowledgements

The authors would like to thank the support of the Natural Science Foundation of China (61102035, 51577046), the China Post-Doctoral Science Foundation under Contracts 2014M551798 and 2015T80651, and the fundamental Research Funds for Central Universities (2014HGCH0012).

Peng Chen received the B.S. degree in Physics from Shangqiu Normal University, Shangqiu, China, in 2013. He is currently a Graduate Student in Electrical Engineering from the School of Electrical Engineering and Automation, Hefei University of Technology. His current interests include fault diagnosis of power electronic circuits, neural networks and its application.

References (29)

  • L. Yuan et al.

    A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor

    IEEE Trans. Instrum. Meas.

    (2010)
  • C.-W. Hsu et al.

    A comparison of methods for multiclass support vector machines

    IEEE. Trans. Neural Netw.

    (2002)
  • O.A. Arqub, M. AL-Smadi, S. Momani, T. Hayat, Numerical solutions of fuzzy differential equations using reproducing...
  • Q. Zhou et al.

    Methodology and equipments for analog circuit parametric faults diagnosis based on matrix eigenvalues

    IEEE Trans. Appl. Supercond.

    (2014)
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    Peng Chen received the B.S. degree in Physics from Shangqiu Normal University, Shangqiu, China, in 2013. He is currently a Graduate Student in Electrical Engineering from the School of Electrical Engineering and Automation, Hefei University of Technology. His current interests include fault diagnosis of power electronic circuits, neural networks and its application.

    Lifen Yuan received the Ph.D. degree in Electrical Engineering in 2011 from Hunan University, China, in 2011. From 2003 to 2010, she worked in Hunan Normal University. Since 2013, she is a Professor in Hefei University of Technology, Hefei, Anhui. Her current interests include the research of circuit diagnosis, advanced signal processing and its application.

    Yigang He received the M.Sc. degree in Electrical Engineering from Hunan University, Changsha, China, in 1992 and the Ph.D. degree in Electrical Engineering from Xi'an Jiaotong University, Xi'an, China, in 1996. He was a Senior Visiting Scholar with the University of Hertfordshire, Hatfield, U.K., in 2002. From 2011, he works as the Head of School of Electrical Engineering and Automation, Hefei University of Technology. His research interests are in the areas of circuit theory and its applications, testing and fault diagnosis of analog and mixed-signal circuits, electrical signal detection, smart grid, radio frequency identification technology, and intelligent signal processing.

    Shuai Luo received the B.E. degree in Resource Prospecting Engineering from Hefei University of Technology, Hefei, China, in 2013, He is currently working toward the M.S. degree at the School of Electrical Engineering and Automation, Hefei University of Technology. His current interests include the compressed sensing of signal, neural networks and its application, and machine learning.

    Lifen Yuan and Peng Chen contributed equally to this work.

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