Pattern Recognition LettersVolume 34, Issue 4, 1 March 2013, Pages 359-360EditorialAdvances in pattern recognition methodology and applicationsAuthor links open overlay panelEdwin Hancock (Guest editor), José Francisco Martínez-Trinidad (Guest editor), Jesús Ariel Carrasco-Ochoa (Guest editor)Show moreShareCitehttps://doi.org/10.1016/j.patrec.2012.11.001Get rights and contentRecommended articlesReferences (0)Cited by (0)View full textCopyright © 2012 Published by Elsevier B.V.