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BISTing Datapaths under Heterogeneous Test Schemes

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Abstract

In this paper, we present a fast and efficient algorithm for BISTing datapaths described at the Register Transfer (RT) level. This algorithm is parameterized by user defined tuning factors allowing tradeoffs between fault coverage, area overhead and test application time. This algorithm is generic in the sense it handle and mixes heterogeneous test pattern generators and compactors.

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Authors and Affiliations

  1. Laboratoire d'Informatique, de Robotique et de Micro-électronique de Montpellier, U.M.R. 5506, 161 rue Ada, 34392, Montpellier Cedex 5, France

    D. Berthelot, M.L. Flottes & B. Rouzeyre

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  1. D. Berthelot
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  2. M.L. Flottes
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  3. B. Rouzeyre
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Berthelot, D., Flottes, M. & Rouzeyre, B. BISTing Datapaths under Heterogeneous Test Schemes. Journal of Electronic Testing 14, 115–123 (1999). https://doi.org/10.1023/A:1008309625123

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