Abstract
The histogram method is a very classical test technique for Analog to Digital Converters (ADCs), but only used for external testing because of the large amount of required hardware resources. This paper discusses the viability of a BIST implementation for this technique. An original approach is developed that permits to extract the ADC parameters with a reduced area overhead. This approach involves (i) the calculation of the parameters using approximations and (ii) the decomposition of the global test in a code-after-code test procedure. These two features allow a significant reduction of the required operative resources and memory dedicated to the storage of experimental data. In addition, the use of a piece-wise approximation for computing the ideal histogram also permits to minimize the memory dedicated to the storage of reference data.
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Azaïs, F., Bernard, S., Bertrand, Y. et al. Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. Journal of Electronic Testing 17, 255–266 (2001). https://doi.org/10.1023/A:1012211328531
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DOI: https://doi.org/10.1023/A:1012211328531