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Multi-TAP Controller Architecture for Digital System Chips

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Abstract

This paper describes an architecture for controlling multiple IEEE 1149.1 compliant TAP controllers on a single digital system chip. The key feature of this architecture is the compatibility with the IEEE 1149.1 standard, and existing debugger software. Results are presented, obtained from an experiment, in which the proposed architecture is mapped on an FPGA to control multiple existing designs with TAP controllers.

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References

  1. ARM Ltd., “IHI-0011A-AMBA Specification Rev2.0,” May 1999. ARM Ltd., http://www.arm.com.

  2. IEEE Computer Society. “IEEE Standard Test Access Port and Boundary-Scan Architecture-IEEE Std. 1149.1-1990,” IEEE, New York, 1990.

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  3. N. Jarwala, “Designing ‘Dual Personality’ IEEE 1149.1 Compliant Multi-Chip Modules,” in Proceedings International Test Conference, USA, 1994, pp. 446-455.

  4. E.-J. Marinissen et al., “A Structured and Scalable Mechanism for Test Access to Embedded Reusable Cores,” in Proceedings International Test Conference, IEEE Computer Society Press, Washington, DC, October 1998, pp. 284-293.

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  5. S.F. Oakland, “Considerations for Implementing IEEE 1149.1 on System-on-a-Chip Integrated Circuits,” in Proceedings International Test Conference, Atlantic City, NJ, USA, 2000, pp. 628-637.

  6. L.D. Whetsel, “An IEEE 1149.1 Based Test Access Architecture For ICs With Embedded Cores,” in Proceedings International Test Conference, Washington, DC, USA, 1997, pp. 69-78.

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Vermeulen, B., Waayers, T. & Bakker, S. Multi-TAP Controller Architecture for Digital System Chips. Journal of Electronic Testing 19, 417–424 (2003). https://doi.org/10.1023/A:1024691909923

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  • DOI: https://doi.org/10.1023/A:1024691909923

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