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Modelling of power metal-oxide semiconductor field-effect transistor for the analysis of switching characteristics in half-bridge converters

Modelling of power metal-oxide semiconductor field-effect transistor for the analysis of switching characteristics in half-bridge converters

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Considering the power metal-oxide semiconductor field-effect transistor (MOSFET) parasitic elements, the switching characteristics of half-bridge converters are analysed. First, the switching operation process of the converter is discussed, including Cdv/dt induced voltage, turn-on and turn-off transient and drain–source voltage oscillations. Then an analytical model of power MOSFET is deduced and validated. Based on the model and Saber software, the switching characteristics of half-bridge converters are simulated with different values of parasitic elements. Finally, according to the simulation results, the design optimisations are presented, and an experimental prototype is used to validate the proposed approach.

References

    1. 1)
      • Shen, Y., Jiang, J., Xiong, Y., Deng, Y., He, X.: `Parasitic inductance effects on the switching loss measurement of power semiconductor devices', IEEE ISIE 2006, 2006, Montréal, Canada, p. 847–852.
    2. 2)
      • Meade, T., O'Sullivan, D., Foley, R., Achimescu, C., Egan, M., McCloskey, P.: `Parasitic inductance effect on switching losses for a high frequency DC–DC converter', Proc. Applied Power Electronics Conf. Expo., 2008, Austin, USA, p. 3–9.
    3. 3)
      • Y. Rena , M. Xu , J. Zhou , F.C. Lee . Analytical loss model of power MOSFET. IEEE Trans. Power Electron. , 2 , 310 - 319
    4. 4)
      • Cho, K.-M., Oh, W.-S., Lee, K.-W., Moon, G.-W.: `A new half bridge converter for the personal computer power supply', Proc. IEEE Power Electronics Specialists Conf., June 2008, Rhodes, Greece, p. 986–991.
    5. 5)
      • Pavier, M., Sawle, A., Woodworth, A., Monteiro, R., Chiu, J., Blake, C.: `High frequency DC–DC power conversion: the influence of package parasitic', Proc. Applied Power Electronics Conf. Expo., 2003, Miami, USA, p. 699–704.
    6. 6)
      • Van Wyk, J.D., Lee, F.C.: `Power electronics technology at the dawn of the new millennium – status and future', Proc. IEEE Power Electronics Specialists Conf., June 1999, Charleston, USA, p. 3–12.
    7. 7)
      • Elbanhawy, A.: `Reducing power losses in MOSFETs by controlling gate parameters', Fairchild Semiconductor Corporation, 2005, Available at http://www.fairchildsemi.com/an/AN/AN-7017.pdf.
    8. 8)
      • Poulsen, B.: `Modelling and test of power semiconductors', 2004, POWER Electronics and Drives Master, Aalborg University, Denmark, Sørensen, M.B..
    9. 9)
      • Sebastian, J., Cobos, J.A., Garcia, O., Uceda, J.: `An overall study of the half bridge complementary-control DC-to-DC converter', Proc. IEEE Power Electronics Specialists Conf., June 1995, Atlanta, USA, p. 1229–1235.
    10. 10)
      • Tolle, T., Duerbaum, T.: `Modeling of ZVS transitions in asymmetrical half-bridge PWM converters', Proc. IEEE Power Electronics Specialists Conf., June 2001, Vancouver, Canada, p. 308–313.
    11. 11)
      • Xiao, Y., Shah, H., Chow, T.P., Gutmann, R.J.: `Analytical modeling and experimental evaluation of interconnect parasitic inductance on MOSFET switching characteristics', Proc. Applied Power Electronics Conf. Expo., 2004, Anaheim, USA, p. 516–521.
    12. 12)
      • D. Xu , H. Lu , L. Huang , S. Azuma , M. Kimata , R. Uchida . Power loss and junction temperature analysis of power semiconductor devices. IEEE Trans. Ind. Appl. , 5 , 1426 - 1431
    13. 13)
      • Han, S.-K., Moon, G.-W., Youn, M.-J.: `A high efficiency ZVS PWM asymmetrical half bridge converter for plasma display panel sustaining power module', Proc. IEEE Power Electronics Specialists Conf., June 2004, Aachen, Germany, 1, p. 776–781.
    14. 14)
      • Orabi, M., Abou-Alfotouh, A., Lotfi, A.: ` capacitance contribution to synchronous buck converter losses', Proc. IEEE Power Electronics Specialists Conf., 2008, Rhodes, Greece, p. 666–672.
    15. 15)
      • B.J. Baliga . (1995) Power semiconductor devices.
    16. 16)
      • Elbanhawy, A.: `Are traditional MOSFET packages suitable for the new generation of DC–DC converters', Power Electronics and Motion Control Conf., 2004, Riga, Latvia, p. 14–16.
    17. 17)
      • Elbanhawy, A., Newberry, W.: `Influence of skin effect on MOSFET losses', 32ndAnnual Conf. IEEE Industrial Electronics Society, 2006, Paris, France, p. 2313–2317.
    18. 18)
      • D. Polenov , J. Lutz , H. Probstle , A. Brosse . Influence of parasitic inductances on transient current sharing in parallel connected synchronous rectifiers and Schottky-barrier diodes. IET Circuits, Devices Syst. , 5 , 387 - 394
    19. 19)
      • Elbanhawy, A.: `The making of the perfect MOSFET', Proc. IEEE Power Electronics Specialists Conf., 2006, Jeju, Korea, p. 1–5.
    20. 20)
      • H. Mao , J. Abu-Quhuouq , S. Luo , I. Batarseh . Zero-voltage-switching half-bridge DC-DC converter with modified PWM control method. IEEE Trans. Power Electron. , 4 , 947 - 958
    21. 21)
      • Elbanhawy, A.: `Parasitic gate resistance and switching performance', Power Electronics and Motion Control Conf., 2006, Portoroz, Slovenia, p. 1–4.
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