A testability measure to improve algebraic test generation
A testability measure to improve algebraic test generation
- Author(s): Antonio Lioy and Marco Mezzalama
- DOI: 10.1049/sm.1984.0013
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- Author(s): Antonio Lioy 1 and Marco Mezzalama 1
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View affiliations
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Affiliations:
1: Dipartimento di Automatica e Informatica, CAD Group, Politecnico di Torino, Torino, Italy
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Affiliations:
1: Dipartimento di Automatica e Informatica, CAD Group, Politecnico di Torino, Torino, Italy
- Source:
Volume 3, Issue 2,
April 1984,
p.
37 – 41
DOI: 10.1049/sm.1984.0013 , Print ISSN 0261-3182, Online ISSN 2053-9096
The paper deals with testability measures of digital systems. Specifically, a new algorithm to evaluate testability measures for circuits described in terms of Boolean equations is presented, and its application to speed up (algebraic) test generation for sequential networks is discussed.
Inspec keywords: field effect integrated circuits; integrated circuit testing; fault location; large scale integration
Other keywords:
Subjects: Other field effect integrated circuits; Electronic engineering computing
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