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Composite-Collector InGaP/GaAs HBTs for Linear Power Amplifiers
Takaki NIWA Takashi ISHIGAKI Naoto KUROSAWA Hidenori SHIMAWAKI Shinichi TANAKA
Publication
IEICE TRANSACTIONS on Electronics
Vol.E88-C
No.4
pp.672-677 Publication Date: 2005/04/01 Online ISSN:
DOI: 10.1093/ietele/e88-c.4.672 Print ISSN: 0916-8516 Type of Manuscript: Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices) Category: Compound Semiconductor Devices Keyword: HBT, gallium arsenide, ruggedness, breakdown voltage, linearity, composite collector, WCDMA,
Full Text: PDF(781.1KB)>>
Summary:
The linear operation of a HBT with a GaAs/InGaP composite collector structure is demonstrated. The composite collector structure allows for a thin collector design that is suitable for the linear operation of a HBT without critical degradation of the breakdown voltage. The load pull measurements under a 1.95 GHz WCDMA signal have shown that a composite-collector HBT with a 400-nm thick collector layer operates with power-added-efficiency (PAE) as high as 53% at VCE = 3.5 V as a result of improved distortion characteristics. Despite the thin collector design, collector-emitter breakdown voltage of 11 V was achieved even at current density of 10 kA/cm2. The composite-collector HBT has even greater advantage for future low voltage (< 3 V) applications where maintaining PAE and linearity becomes one of the critical issues.
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