A Novel Selected Area Laser Assisted (SALA) System for Crystallization and Doping Processes in Low-Temperature Poly-Si Thin-Film Transistors

Ryoichi ISHIHARA
Arie GLAZER
Yoel RAAB
Peter RUSIAN
Mannie DORFAN
Benzi LAVI
Ilya LEIZERSON
Albert KISHINEVSKY
Yvonne van ANDEL
Xin CAO
Wim METSELAAR
Kees BEENAKKER
Sara STOLYAROVA
Yael NEMIROVSKY

Publication
IEICE TRANSACTIONS on Electronics   Vol.E89-C    No.10    pp.1377-1382
Publication Date: 2006/10/01
Online ISSN: 1745-1353
DOI: 10.1093/ietele/e89-c.10.1377
Print ISSN: 0916-8516
Type of Manuscript: Special Section INVITED PAPER (Special Section on Electronic Displays)
Category: 
Keyword: 
polycrystalline-Si,  thin-film transistors,  gas immersed laser doping,  solid-state laser,  

Full Text: PDF(1.2MB)>>
Buy this Article



Summary: 
CMOS poly-Si thin-film transistors (TFTs) were fabricated through crystallization and GILD processes by a novel selected area laser assisted (SALA) system. The system enables a local area irradiation of small beams of a pulsed solid-state laser of frequency tripled Nd:YAG. The novel TFT process eliminated 3 doping mask steps of the conventional process. On-off current ratios for both types of poly-Si TFTs were improved by SALA. The field effect mobility of n- and p-channel TFTs is 84 cm2/Vs and 75 cm2/Vs, respectively.