A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters

Kicheol KIM; Youbean KIM; Incheol KIM; Hyeonuk SON; Sungho KANG

doi:10.1093/ietele/e91-c.4.670

Regular Section

A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters

Kicheol KIM, Youbean KIM, Incheol KIM, Hyeonuk SON, Sungho KANG

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Keywords: ADC testing, BIST, histogram testing

JOURNAL RESTRICTED ACCESS

2008 Volume E91.C Issue 4 Pages 670-672

DOI https://doi.org/10.1093/ietele/e91-c.4.670

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Abstract

In this letter a histogram-based BIST (Built-In Self-Test) approach for deriving the main characteristic parameters of an ADC (Analog to Digital Converter) such as offset, gain and non-linearities is proposed. The BIST uses a ramp signal as an input signal and two counters as a response analyzer to calculate the derived static parameters. Experimental results show that the proposed method reduces the hardware overhead and testing time while detecting any static faults in an ADC.

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