Non Destructive Evaluation in Multilayer Structure Using the High Tc SQUID

Hideaki NAKANE

Publication
IEICE TRANSACTIONS on Electronics   Vol.E88-C    No.2    pp.188-191
Publication Date: 2005/02/01
Online ISSN: 
DOI: 10.1093/ietele/e88-c.2.188
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Superconducting Electronic Devices and Their Applications)
Category: SQUIDs
Keyword: 
high Tc SQUID,  eddy current nondestructive testing,  phase shift,  

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Summary: 
The High Tc SQUID was used in an unshielded environment to make eddy current nondestructive testing measurement on a multi-layer aluminum structure. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using phase shift with no magnetic shielding around the specimen.