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A Reduced-Sample-Rate Sigma-Delta-Pipeline ADC Architecture for High-Speed High-Resolution Applications
Vahid MAJIDZADEH Omid SHOAEI
Publication
IEICE TRANSACTIONS on Electronics
Vol.E89-C
No.6
pp.692-701 Publication Date: 2006/06/01 Online ISSN: 1745-1353
DOI: 10.1093/ietele/e89-c.6.692 Print ISSN: 0916-8516 Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit and Device Technologies) Category: Keyword: sigma-delta-pipeline, reduced-sample-rate architecture, switched-capacitor circuit, IIR filters, single OTA implementation,
Full Text: PDF(701.9KB)>>
Summary:
A reduced-sample-rate (RSR) sigma-delta-pipeline (SDP) analog-to-digital converter architecture suitable for high-resolution and high-speed applications with low oversampling ratios (OSR) is presented. The proposed architecture employs a class of high-order noise transfer function (NTF) with a novel pole-zero locations. A design methodology is developed to reach the optimum NTF. The optimum NTF determines the location of the non-zero poles improving the stability of the loop and implementing the reduced-sample-rate structure, simultaneously. Unity gain signal transfer function to mitigate the analog circuit imperfections, simplified analog implementation with reduced number of operational transconductance amplifiers (OTAs), and novel, aggressive yet stable NTF with high out of band gain to achieve larger peak signal-to-noise ratio (SNR) are the main features of the proposed NTF and ADC architecture. To verify the usefulness of the proposed architecture, NTF, and design methodology, two different cases are investigated. Simulation results show that with a 4th-order modulator, designed making use of the proposed approach, the maximum SNDR of 115 dB and 124.1 dB can be achieved with only OSR of 8, and 16 respectively.
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