A New Analog-to-Digital Converter BIST Considering a Transient Zone

Incheol KIM
Kicheol KIM
Youbean KIM
HyeonUk SON
Sungho KANG

Publication
IEICE TRANSACTIONS on Electronics   Vol.E90-C    No.11    pp.2161-2163
Publication Date: 2007/11/01
Online ISSN: 1745-1353
DOI: 10.1093/ietele/e90-c.11.2161
Print ISSN: 0916-8516
Type of Manuscript: LETTER
Category: Integrated Electronics
Keyword: 
static ADC built-in self-test,  transient zone problem,  

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Summary: 
A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.