Publication IEICE TRANSACTIONS on Information and SystemsVol.E88-DNo.9pp.2209-2212 Publication Date: 2005/09/01 Online ISSN: DOI: 10.1093/ietisy/e88-d.9.2209 Print ISSN: 0916-8532 Type of Manuscript: LETTER Category: Dependable Computing Keyword: transient bit error, memory scrubbing, reliability, embedded system,
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Summary: A new simple recovery scheme for transient bit errors in the RAM of a ROM-based embedded system is presented, which exploits the information stored in the ROM. And a new scrubbing technique suitable to the proposed recovery scheme is also presented. With the proposed recovery scheme and scrubbing technique, the reliability of the RAM against transient bit errors can be improved remarkably with no additional extra memory and scrubbing overhead.