Transient Bit Error Recovery Scheme for ROM-Based Embedded Systems

Sang-Moon RYU
Dong-Jo PARK

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E88-D    No.9    pp.2209-2212
Publication Date: 2005/09/01
Online ISSN: 
DOI: 10.1093/ietisy/e88-d.9.2209
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Dependable Computing
Keyword: 
transient bit error,  memory scrubbing,  reliability,  embedded system,  

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Summary: 
A new simple recovery scheme for transient bit errors in the RAM of a ROM-based embedded system is presented, which exploits the information stored in the ROM. And a new scrubbing technique suitable to the proposed recovery scheme is also presented. With the proposed recovery scheme and scrubbing technique, the reliability of the RAM against transient bit errors can be improved remarkably with no additional extra memory and scrubbing overhead.


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