A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets

Dong-Sup SONG
Sungho KANG

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E89-D    No.1    pp.354-357
Publication Date: 2006/01/01
Online ISSN: 1745-1361
DOI: 10.1093/ietisy/e89-d.1.354
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Dependable Computing
Keyword: 
deterministic logic BIST,  embedded core testing,  

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Summary: 
In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST that can improve the embedding probabilities of random-pattern-resistant-patterns. A simulated annealing based algorithm that maximizes the embedding probabilities of scan test cubes has been developed to reorder scan cells. Experimental results demonstrate that the proposed CRIN BIST technique reduces test time by 35% and the storage requirement by 39% in comparison with previous work.


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