Summary
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On Finding Don't Cares in Test Sequences for Sequential Circuits Yoshinobu HIGAMI Seiji KAJIHARA Irith POMERANZ Shin-ya KOBAYASHI Yuzo TAKAMATSU Publication IEICE TRANSACTIONS on Information and Systems Vol.E89-D No.11 pp.2748-2755 Publication Date: 2006/11/01 Online ISSN: 1745-1361 DOI: 10.1093/ietisy/e89-d.11.2748 Print ISSN: 0916-8532 Type of Manuscript: PAPER Category: Dependable Computing Keyword: test generation, don't care value, sequential circuit, stuck-at fault, Full Text: PDF(195KB)>>
Summary: Recently there are various requirements for LSI testing, such as test compaction, test compression, low power dissipation or increase of defect coverage. If test sequences contain lots of don't cares (Xs), then their flexibility can be used to meet the above requirements. In this paper, we propose methods for finding as many Xs as possible in test sequences for sequential circuits. Given a fully specified test sequence generated by a sequential ATPG, the proposed methods produce a test sequence containing Xs without losing stuck-at fault coverage of the original test sequence. The methods apply an approach based on fault simulation, and they introduce some heuristics for reducing the simulation effort. Experimental results for ISCAS'89 benchmark circuits show the effectiveness of the proposed methods. | ||||||||||
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