Publication IEICE TRANSACTIONS on Information and SystemsVol.E90-DNo.3pp.685-687 Publication Date: 2007/03/01 Online ISSN: 1745-1361 DOI: 10.1093/ietisy/e90-d.3.685 Print ISSN: 0916-8532 Type of Manuscript: LETTER Category: Dependable Computing Keyword: current test, open node defect, floating gate defect, frequency analysis,
Full Text: PDF(139.3KB)>>
Summary: A method to detect open node defects that cannot be detected by the conventional IDDQ test method has previously been proposed employing a sinusoidal wave superposed on the DC supply voltage. The present paper proposes a strategy to improve the detectability of the test method by means of frequency analysis of the supply current. In this strategy, defects are detected by determining whether secondary harmonics of the sinusoidal wave exist in the supply current. The effectiveness of the method is confirmed by experiments on two CMOS NAND gate packages (SSIs).