The switching of high-voltage capacitor banks for reactive power and voltage control usually generates significant transients. These high amplitude disturbances have a tendency to damage or reduce the lifespan of capacitor units, thus leading to complete failure of capacitor banks. Pre-insertion resistors or inductors as well as synchronous switching (Point on Wave) methods can be used to mitigate transient phenomenon. In this work, Electromagnetic Transient Program simulations of transient voltage for single and back to back capacitor banks indicate that pre-insertion resistors methodology can significantly reduce transients, and could therefore be combined with synchronous switching to effect transient mitigation.