Stochastic model of image signals for charged particle detector | IEEE Conference Publication | IEEE Xplore

Stochastic model of image signals for charged particle detector


Abstract:

The Poisson Impulse Accumulation Process model is proposed, which describes sampled image signals detected by charged particle beam equipment with a stochastic process. I...Show More

Abstract:

The Poisson Impulse Accumulation Process model is proposed, which describes sampled image signals detected by charged particle beam equipment with a stochastic process. Image signals can be modeled simply by accumulation of pulses in a sampling period. The pulses are generated from the random numbers which obey the Poisson distribution. Statistical analysis confirms that images generated by the model behave well like actually detected signals.
Date of Conference: 28-31 October 2002
Date Added to IEEE Xplore: 06 January 2003
Print ISBN:0-7803-7690-0
Conference Location: Denpasar, Indonesia

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