Abstract:
This paper presents the results of parametric testing of digital ICs using a dedicated Mixed Signal Automatic Testing Equipment. Due to the prohibitive price of the ATE e...Show MoreMetadata
Abstract:
This paper presents the results of parametric testing of digital ICs using a dedicated Mixed Signal Automatic Testing Equipment. Due to the prohibitive price of the ATE equipment and dedicated Device Interface Board (DIB) for digital Integrated Circuits (ICs), a DIB for analog circuits was used to perform the testing. Despite the challenges presented by the experiments, the results prove to be accurate for the performed tests, according to the data sheet of the digital ICs and production test data provided by the manufacturer.
Date of Conference: 22-24 May 2014
Date Added to IEEE Xplore: 17 July 2014
ISBN Information: