An automated test framework for SRAM-based FPGA is presented. With the framework, test configurations of different categories can be partially or completely generated, and the tests be running using the generated configurations. Data driven design provides the test framework the flexibility of change the user interface and the command line arguments via software configuration files, without modifying the source code of the framework. Experimental results shows that the test framework handles the complicate test flow efficiently, and release the test engineer from the tedious testing work.