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Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices | IEEE Conference Publication | IEEE Xplore
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Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices

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K. Katsuki; M. Kotani; K. Kobayashi; H. Onodera
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Abstract:

It is possible to enhance speed and yield of reconfigurable devices utilizing WID variations. An LUT array LSI is fabricated on a 90nm process to measure WID and D2D vari...Show More

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Abstract:

It is possible to enhance speed and yield of reconfigurable devices utilizing WID variations. An LUT array LSI is fabricated on a 90nm process to measure WID and D2D variations. Performance fluctuations are measured by counting the number of LUTs through which a signal is passing within a certain time. D2D and WID variations are clearly observed by the measurement
Published in: Asia and South Pacific Conference on Design Automation, 2006.
Date of Conference: 24-27 January 2006
Date Added to IEEE Xplore: 13 March 2006
Print ISBN:0-7803-9451-8

ISSN Information:

DOI: 10.1109/ASPDAC.2006.1594661
Conference Location: Yokohama, Japan
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