Yield-preferred via insertion based on novel geotopological technology | IEEE Conference Publication | IEEE Xplore

Yield-preferred via insertion based on novel geotopological technology


Abstract:

Yield-preferred via insertion is an effective method to reduce the yield loss caused by via failures. The existing methods to apply the redundant-cut vias in metal layers...Show More

Abstract:

Yield-preferred via insertion is an effective method to reduce the yield loss caused by via failures. The existing methods to apply the redundant-cut vias in metal layers are not efficient nor adequate. In this paper, we present an effective and efficient yield-preferred via insertion method based on a novel geotopological layout platform, GEOTOP. Our method chooses the most yield-favored via candidate and insert it into the layout without causing any design rule violations. Experiments with real industry designs show that our method can achieve very high rate of yield-preferred via without increasing the design die size within acceptable running time
Date of Conference: 24-27 January 2006
Date Added to IEEE Xplore: 13 March 2006
Print ISBN:0-7803-9451-8

ISSN Information:

Conference Location: Yokohama, Japan

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